Graduate course

Physical methods in Surface and Material Characterisation

(KTH course code KD3390)

This course will provide a comprehensive overview of the most important and state of the art methods used in the characterization of materials. The techniques covered include physical and spectroscopic methods of characterization, highlighting approaches to their use to define important attributes of the atomic, compositional/chemical, and mesoscopic/physical/morphological features of materials.

The course is lectured by Professor Ralph Nuzzo (a keynote speaker at the conference) and administered by Mark Rutland at KTH.
Registration: Email for registration with cc to Georgia Pilkington

The course will be run remotely except for the final meeting at the conference Monday afternoon 23rd/10.

Due to a grant from KTH (thanks to Prof Stefan Östlund and Erica Buck) under the KTH-University of Illinois at Urbana Champaign partnership agreement, the lectures have been recorded at KTH Media Productions. The links to the videos on KTHs Youtube channel will be made available to members of the group.

The course will be run from mid august over 9 weeks with one topic per week. (see below)   Each week there will be a quiz and an onlinemeeting scheduled at 4 – 5.30 pm Swedish time each Thursday afternoon. Each student will also present at one of the online meetings with a short (5 -10 min) presentation of how one of the techniques has been applied – either in their own research, or in a subject they identify as being of interest. These presentations will be examined by the hosts but also “peer examined” – ie all the other students will provide feedback and grading (anonymously) as part of the examination process.

On the Monday afternoon (and possibly Tuesday morning) before the conference there will be a meeting and each student will present for 5-10 mins on “what techniques are missing”.  The best presentation will have the opportunity to present at the conference.

  • The lecture topics and methods of characterization that will be covered include:
  • (Introduction: What is a material? What is materials chemistry?
  • Overview of protocols and probes used in materials characterization.
  • Surface Analysis: X-ray Photoelectron Spectroscopy (XPS); Auger Electron Spectroscopy (AES).
  • Ion Beam Methods: Secondary Ion Mass Spectroscopy (SIMS); Rutherford Back-scattering Spectroscopy (RBS).
  • Introduction to Microscopy.
  • Scanned Probe Methods: STM and AFM.
  • Electron Microscopy: Scanning Electron Microscopy (SEM); Transmission Electron Microscopy (TEM); Scanning Transmission Electron Microscopy (STEM).
  • Diffraction Methods: X-ray Diffraction (XRD); Electron Diffraction
  • Optical and Spectroscopic Methods: X-ray Absorption Spectroscopy; Infrared Spectroscopy; Ellipsometry.
  • Polymer Characterization.